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3D Nano Characterization Tools
The scanning electron microscope (SEM) is a type of electron microscope that characterize the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. SEM can produce very detailed 3 dimensional high-resolution images of a sample surface, revealing details about 1 to 5 nm in size. Image of Gold Nanoparticles can be seen by SEM and has the size in 5nm at 100nm resolution.
Energy Dispersive Spectroscopy (EDS):  The Energy Dispersive Spectroscopy (EDS) is an analytical technique used for the chemical characterization of a specimen used in concert with SEM for compositional microanalysis. It is useful for material characterization. The SEM-EDS technique is applied for
Atomic Force Microscope (AFM):  The Atomic Force Microscope (AFM ) is being used to solve processing and materials problems in a wide range of technologies affecting the electronics, telecommunications, biological, chemical, automotive, aerospace, and energy industries. The materials being investigating include thin and thick film coatings, ceramics, composites, glasses, synthetic and biological membranes, metals, polymers, and semiconductors The AFM is being applied to studies of phenomena such as abrasion, adhesion, cleaning, corrosion, etching, friction, lubrication, plating, and polishing. By using AFM, one can not only image the surface in atomic resolution but also measure the force at nano Newton scale. In AFM, the information is gathered by "feeling" the surface with a mechanical probe. |
Scanning Electron Microscope (SEM):
