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Nano Science Tachnology Consortium

Nano Characterization

Nanoscience studies the concepts and facts of nanomaterials and Nanotechnology apply these concepts to produce desirable devices and products. To examine the production of devices or products, characterization is very important technique. Characterization is accomplished by instrumentation. For example, Nanoparticles can be seen only by high resolution electron microscopy such as Scanning Electron Microscope and Transmission Electron Microscope. There are number of characterization tools to analyze nano materials.

Atomic Force Microscope is capable of measuring nanometer scale images of insulating surfaces with little or no sample preparation; it has a vast number of applications in many areas of science and technology. The AFM measures three dimensional images of surfaces and is very helpful for visualizing surface topography. Nanometer sized dimensions of surface features are measurable with the AFM.

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